DocumentCode :
714144
Title :
Detection of narrow-band sonar signal on a Riemannian manifold
Author :
Jiaping Liang ; Wong, Kon Max ; Zhang, Jian Kang
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
fYear :
2015
fDate :
3-6 May 2015
Firstpage :
959
Lastpage :
964
Abstract :
We consider the problem of narrow-band signal detection in a passive sonar environment. The classical method employs a fast Fourier Transform (FFT) delay-sum beamformer in which the feature used in detection is the output of the FFT spectrum analyser in each frequency bin. This is compared to a locally estimated mean noise power to establish a likelihood ratio test (LRT). In this paper, we suggest to use the power spectral density (PSD) matrix of the spectrum analyser output as the feature for detection due to the additional cross-correlation information contained in such matrices. However, PSD matrices have structural constraints and describe a manifold in the signal space. Thus, instead of the widely used Euclidean distance (ED), we must use the Riemannian distance (RD) on the manifold for measuring the similarity between such features. Here, we develop methods for measuring the Fréchet mean of noise PSD matrices and optimum weighting matrices for measuring similarity of noise and signal PSD matrices. These are then used to develop a decision rule for the detection of narrow-band sonar signals using PSD matrices. The results yielded by the new detection method are very encouraging.
Keywords :
fast Fourier transforms; signal detection; sonar signal processing; Euclidean distance; FFT delay-sum beamformer; FFT spectrum analyser; PSD matrices; PSD matrix; Riemannian distance; Riemannian manifold; cross-correlation information; fast Fourier Transform; likelihood ratio test; narrow-band sonar signal detection; passive sonar environment; power spectral density; Correlation; Feature extraction; Manifolds; Noise; Sonar detection; Riemannian geometry; signal detection; signal features;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering (CCECE), 2015 IEEE 28th Canadian Conference on
Conference_Location :
Halifax, NS
ISSN :
0840-7789
Print_ISBN :
978-1-4799-5827-6
Type :
conf
DOI :
10.1109/CCECE.2015.7129405
Filename :
7129405
Link To Document :
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