DocumentCode :
714176
Title :
Contourlet domain image denoising based on the Bessel k-form distribution
Author :
Sadreazami, H. ; Ahmad, M. Omair ; Swamy, M.N.S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
fYear :
2015
fDate :
3-6 May 2015
Firstpage :
1234
Lastpage :
1237
Abstract :
Statistical image modeling has attracted great attention in the field of image denoising. In this work, a new image denoising method in the contourlet domain is introduced in which the contourlet coefficients of images are modeled by using the Bessel k-form prior. A noisy image is decomposed into a low frequency approximation sub-image and a series of high frequency detail sub-images at different scales and directions via the contourlet transform. To estimate the noise-free coefficients in detail subbands, a Bayesian estimator is developed utilizing the Bessel k-form distribution. In order to estimate the parameters of the distribution, a characteristic function-based technique is used. Simulation results on standard test images show improved performance both in visual quality and in terms of the peak signal-to-noise ratio and structural similarity index as compared to some of the existing denoising methods. The proposed method also achieves an excellent balance between noise suppression and details preservation.
Keywords :
Bayes methods; approximation theory; image denoising; parameter estimation; statistical distributions; transforms; Bayesian estimator; Bessel k-form distribution; characteristic function-based technique; contourlet coefficients; contourlet domain image denoising; low frequency approximation subimage; noise suppression; noise-free coefficients; noisy image decomposition; parameter estimation; peak signal-to-noise ratio; statistical image modeling; structural similarity index; visual quality; Bayes methods; Image denoising; Noise; Noise measurement; Noise reduction; Probability density function; Transforms; Bayesian estimator; Bessel k-form distribution; Image denoising; contourlet transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering (CCECE), 2015 IEEE 28th Canadian Conference on
Conference_Location :
Halifax, NS
ISSN :
0840-7789
Print_ISBN :
978-1-4799-5827-6
Type :
conf
DOI :
10.1109/CCECE.2015.7129454
Filename :
7129454
Link To Document :
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