• DocumentCode
    714415
  • Title

    Fourier analysis-based automatic test pattern generation for combinational circuits

  • Author

    Ayav, Tolga

  • Author_Institution
    Bilgisayar Muhendisligi Bolumu, Izmir Yuksek Teknol. Enstitusu, İzmir, Turkey
  • fYear
    2015
  • fDate
    16-19 May 2015
  • Firstpage
    128
  • Lastpage
    131
  • Abstract
    Fourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits.
  • Keywords
    Fourier analysis; automatic test pattern generation; combinational circuits; integrated circuit testing; Fourier analysis; automatic test pattern generation; combinational circuits; Automatic test pattern generation; Benchmark testing; Boolean functions; Combinational circuits; Computers; Gold; IEEE Xplore; Combinational circuit; Fourier analysis; Walsh transformation; automatic test pattern generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing and Communications Applications Conference (SIU), 2015 23th
  • Conference_Location
    Malatya
  • Type

    conf

  • DOI
    10.1109/SIU.2015.7129939
  • Filename
    7129939
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=714415