Title :
Fourier analysis-based automatic test pattern generation for combinational circuits
Author_Institution :
Bilgisayar Muhendisligi Bolumu, Izmir Yuksek Teknol. Enstitusu, İzmir, Turkey
Abstract :
Fourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits.
Keywords :
Fourier analysis; automatic test pattern generation; combinational circuits; integrated circuit testing; Fourier analysis; automatic test pattern generation; combinational circuits; Automatic test pattern generation; Benchmark testing; Boolean functions; Combinational circuits; Computers; Gold; IEEE Xplore; Combinational circuit; Fourier analysis; Walsh transformation; automatic test pattern generation;
Conference_Titel :
Signal Processing and Communications Applications Conference (SIU), 2015 23th
Conference_Location :
Malatya
DOI :
10.1109/SIU.2015.7129939
