Title :
Cost analysis of compressive sensing for MIMO STAP random arrays
Author :
Kim, Haley H. ; Govoni, Mark A. ; Haimovich, Alexander M.
Author_Institution :
Electr. & Comput. Eng. Dept., New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
This work proposes an augmented variation of conventional space-time adaptive processing (STAP), and explores the application of multi-branch matching pursuit (MBMP) to a multiple-input multiple-output (MIMO) beamformer whose steering vector is created over an array having random, inter-element spacing. By applying compressive sensing (CS), a radar system is able to minimize the undesired effects of an undersampled array while providing adequate clutter suppression and reduced burden on array integration. In this paper, we compare the performance and computational complexity of the MBMP applied to the STAP problem and the STAP beamformer. In addition we propose two methods to reduce the computational complexity of MBMP, a modification to the MBMP algorithm which we refer to as truncated MBMP, and a grid refinement technique. We evaluate our approach and extend this aspect to help in understanding the necessary computations required for practical target detection.
Keywords :
MIMO radar; array signal processing; compressed sensing; computational complexity; interference suppression; iterative methods; radar clutter; radar detection; space-time adaptive processing; time-frequency analysis; CS; MBMP; MIMO STAP random arrays; MIMO beamformer; STAP beamformer; STAP problem; array integration; clutter suppression; compressive sensing; computational complexity; computational complexity reduction; cost analysis; grid refinement technique; interelement spacing; multibranch matching pursuit; multiple-input multiple-output beamformer; radar system; space-time adaptive processing; steering vector; target detection; truncated MBMP; Clutter; Compressed sensing; Computational complexity; Doppler effect; MIMO; Matching pursuit algorithms;
Conference_Titel :
Radar Conference (RadarCon), 2015 IEEE
Conference_Location :
Arlington, VA
Print_ISBN :
978-1-4799-8231-8
DOI :
10.1109/RADAR.2015.7131137