Title :
Reliability Concerns Related With the Usage of Inorganic Particles in White Light-Emitting Diodes
Author :
Lilin Liu ; Xizhao Tan ; Yizhou Li ; Mingyang Wu ; Dongdong Teng ; Gang Wang
Author_Institution :
Sch. of Phys. & Eng., Sun Yat-sen Univ., Guangzhou, China
Abstract :
Although adding nonemitting inorganic particles to the silicone encapsulant can be a strategy to improve reliabilities of white light-emitting diodes (wLEDs), its validity depends on the inorganic/organic interface compatibility. This work employs ZnO nanoparticles (NPs) with different surface conditions to study the physical relationships between degradation of wLEDs and inorganic/organic interfaces. Experimentally, it is found that 1 wt% of ZnO@SiO2 NPs in lens can slow down the degradation rate of wLEDs under both UV exposure conditions and pressure cooking test conditions.
Keywords :
II-VI semiconductors; light emitting diodes; reliability; silicon compounds; silicones; wide band gap semiconductors; zinc compounds; UV exposure conditions; ZnO-SiO2; inorganic-organic interface compatibility; lens; nonemitting inorganic particles; pressure cooking test conditions; reliability concerns; silicone encapsulant; wLED degradation rate; white light-emitting diodes; Aging; Degradation; Educational institutions; Lenses; Light emitting diodes; Materials; Zinc oxide; Inorganic nanoparticle; UV exposure; pressure cooking test; reliability; white light-emitting diode (wLED);
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2014.2358256