• DocumentCode
    715457
  • Title

    Gaussian estimation under attack uncertainty

  • Author

    Javidi, Tara ; Kaspi, Yonatan ; Tyagi, Himanshu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, La Jolla, CA, USA
  • fYear
    2015
  • fDate
    April 26 2015-May 1 2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We consider the estimation of a standard Gaussian random variable under an observation attack where an adversary may add a zero mean Gaussian noise with variance in a bounded, closed interval to an otherwise noiseless observation. A straightforward approach would entail either ignoring the attack and simply using an optimal estimator under normal operation or taking the worst-case attack into account and using a minimax estimator that minimizes the cost under the worst-case attack. In contrast, we seek to characterize the optimal tradeoff between the MSE under normal operation and the MSE under the worst-case attack. Equivalently, we seek a minimax estimator for any fixed prior probability of attack. Our main result shows that a unique minimax estimator exists for every fixed probability of attack and is given by the Bayesian estimator for a least-favorable prior on the set of possible variances. Furthermore, the least-favorable prior is unique and has a finite support. While the minimax estimator is linear when the probability of attack is 0 or 1, our numerical results show that the minimax linear estimator is far from optimal for all other probabilities of attack and a simple nonlinear estimator does much better.
  • Keywords
    Bayes methods; Gaussian noise; minimax techniques; signal processing; Bayesian estimator; Gaussian estimation; attack uncertainty; minimax linear estimator; standard Gaussian random variable; worst-case attack; zero mean Gaussian noise; Bayes methods; Estimation; Gaussian noise; Random variables; Robustness; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Workshop (ITW), 2015 IEEE
  • Conference_Location
    Jerusalem
  • Print_ISBN
    978-1-4799-5524-4
  • Type

    conf

  • DOI
    10.1109/ITW.2015.7133120
  • Filename
    7133120