DocumentCode :
71558
Title :
Direct Band-to-Band Tunneling in Reverse Biased  \\hbox {MoS}_{2} Nanoribbon p-n Junctions
Author :
Ghosh, Ram Krishna ; Mahapatra, Santanu
Author_Institution :
Dept. of Electron. Syst. Eng., Indian Inst. of Sci., Bangalore, India
Volume :
60
Issue :
1
fYear :
2013
fDate :
Jan. 2013
Firstpage :
274
Lastpage :
279
Abstract :
We investigate the direct band-to-band tunneling (BTBT) in a reverse biased molybdenum disulfide (MoS2) nanoribbon p-n junction by analyzing the complex band structure obtained from semiempirical extended Hückel method under relaxed and strained conditions. It is demonstrated that the direct BTBT is improbable in relaxed monolayer nanoribbon; however, with the application of certain uniaxial tensile strain, the material becomes favorable for it. On the other hand, the relaxed bilayer nanoribbon is suitable for direct BTBT but becomes unfavorable when the applied uniaxial tensile or compressive strain goes beyond a certain limit. Considering the Wentzel-Kramers-Brillouin approximation, we evaluate the tunneling probability to estimate the tunneling current for a small applied reverse bias. Reasonably high tunneling current in the MoS2 nanoribbons shows that it can take advantage over graphene nanoribbon in future tunnel field-effect transistor applications.
Keywords :
field effect transistors; graphene; molybdenum compounds; nanoribbons; p-n junctions; tunnel transistors; MoS2; Wentzel-Kramers-Brillouin approximation; complex band structure; compressive strain; direct BTBT; direct band-to-band tunneling; graphene nanoribbon; high tunneling current; relaxed monolayer nanoribbon; reverse biased nanoribbon p-n junctions; semiempirical extended Hückel method; tunnel field-effect transistor applications; uniaxial tensile strain; Materials; P-n junctions; Photonic band gap; Strain; Transistors; Tunneling; Bandgap; band-to-band tunneling (BTBT); complex band structure; nanoribbon; strain;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2226729
Filename :
6355976
Link To Document :
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