• DocumentCode
    71558
  • Title

    Direct Band-to-Band Tunneling in Reverse Biased  \\hbox {MoS}_{2} Nanoribbon p-n Junctions

  • Author

    Ghosh, Ram Krishna ; Mahapatra, Santanu

  • Author_Institution
    Dept. of Electron. Syst. Eng., Indian Inst. of Sci., Bangalore, India
  • Volume
    60
  • Issue
    1
  • fYear
    2013
  • fDate
    Jan. 2013
  • Firstpage
    274
  • Lastpage
    279
  • Abstract
    We investigate the direct band-to-band tunneling (BTBT) in a reverse biased molybdenum disulfide (MoS2) nanoribbon p-n junction by analyzing the complex band structure obtained from semiempirical extended Hückel method under relaxed and strained conditions. It is demonstrated that the direct BTBT is improbable in relaxed monolayer nanoribbon; however, with the application of certain uniaxial tensile strain, the material becomes favorable for it. On the other hand, the relaxed bilayer nanoribbon is suitable for direct BTBT but becomes unfavorable when the applied uniaxial tensile or compressive strain goes beyond a certain limit. Considering the Wentzel-Kramers-Brillouin approximation, we evaluate the tunneling probability to estimate the tunneling current for a small applied reverse bias. Reasonably high tunneling current in the MoS2 nanoribbons shows that it can take advantage over graphene nanoribbon in future tunnel field-effect transistor applications.
  • Keywords
    field effect transistors; graphene; molybdenum compounds; nanoribbons; p-n junctions; tunnel transistors; MoS2; Wentzel-Kramers-Brillouin approximation; complex band structure; compressive strain; direct BTBT; direct band-to-band tunneling; graphene nanoribbon; high tunneling current; relaxed monolayer nanoribbon; reverse biased nanoribbon p-n junctions; semiempirical extended Hückel method; tunnel field-effect transistor applications; uniaxial tensile strain; Materials; P-n junctions; Photonic band gap; Strain; Transistors; Tunneling; Bandgap; band-to-band tunneling (BTBT); complex band structure; nanoribbon; strain;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2226729
  • Filename
    6355976