Title :
Derivation, Analysis, and Comparison of Nonisolated Single-Switch High Step-up Converters With Low Voltage Stress
Author :
Jae-Kuk Kim ; Gun-Woo Moon
Author_Institution :
Dept. of Power Dev., SamsungElectro-Mech. Co. Ltd., Daejeon, South Korea
Abstract :
This paper presents nonisolated single-switch high step-up converters with low voltage stress. Based on the conventional flyback converter, one single-switch high step-up converter is derived. The voltage stresses on the switch and diodes are limited by using a clamping diode and voltage doubler structure. Also, to further reduce the voltage stresses of them, another single-switch high step-up converter is proposed simply by using one additional capacitor and rearranging the components. Thus, lower voltage-rated switch and diodes can be used, which results in higher efficiency. The operational principle, analysis and design considerations of each converter are presented in this paper. The validity of this study is confirmed by the experimental results from 24 V input and 250 V/125 W output prototype.
Keywords :
DC-DC power convertors; capacitors; diodes; switching convertors; voltage multipliers; capacitor; clamping diode; flyback converter; nonisolated single switch high step-up converter; power 125 W; voltage 250 V; voltage doubler structure; voltage stress reduction; Capacitors; Clamps; Leakage currents; Semiconductor diodes; Stress; Switches; Topology; High step-up converter; low voltage stress; nonisolated; single switch;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2014.2316324