Title :
A practical approach for logic simplification based on fault acceptability for error tolerant application
Author :
Ichihara, Hideyuki ; Kamei, Junpei ; Iwagaki, Tsuyoshi ; Inoue, Tomoo
Author_Institution :
Grad. Sch. of Inf. Sci., Hiroshima City Univ., Hiroshima, Japan
Abstract :
In this paper, we focus on fault-acceptability-based logic simplification for error tolerant application. We propose a practical (or cost-effective) logic simplification algorithm. The proposed algorithm (1) avoids acceptability identification for faults that are potentially unacceptable and (2) isolates redundancy identification procedure from acceptability identification. Experimental results show that, compared with a previous algorithm, the proposed algorithm can reduce the computational effort without losing the ability of logic simplification.
Keywords :
integrated circuit testing; logic testing; redundancy; acceptability identification; error tolerant application; fault acceptability; logic simplification algorithm; redundancy identification procedure; Circuit faults; Cities and towns; Combinational circuits; Fault diagnosis; Redundancy; Very large scale integration;
Conference_Titel :
Test Symposium (ETS), 2015 20th IEEE European
Conference_Location :
Cluj-Napoca
DOI :
10.1109/ETS.2015.7138727