DocumentCode :
715959
Title :
Noise modeling methodology of an integrated circuit for quartz crystal oscillator
Author :
Nikolay, Vorobyev ; Joel, Imbaud ; Thomas, Baron ; Gilles, Cibiel ; Serge, Galliou
Author_Institution :
Time & Freq. Dept., UTBM, Besancon, France
fYear :
2015
fDate :
12-16 April 2015
Firstpage :
125
Lastpage :
128
Abstract :
This paper reports the methodology and results of noise modeling and tests of a quartz crystal oscillator based on a dedicated integrated circuit (ASIC). Unfortunately, the phase noise of the inner sustaining amplifier is unknown. The challenge is to evaluate the performance limits of this ASIC in an oscillator circuit. The oscillator phase noise computation results from the knowledge of individual intrinsic noise of the sustaining amplifier and the resonator respectively are presented. Moreover the simulation results are compared with the oscillator phase noise measurements.
Keywords :
amplifiers; crystal oscillators; integrated circuit noise; integrated circuit testing; phase noise; quartz; ASIC; individual intrinsic noise; inner sustaining amplifier; integrated circuit; noise modeling methodology; phase noise measurement; quartz crystal oscillator; resonator; Application specific integrated circuits; Integrated circuit modeling; Noise measurement; Phase measurement; Phase noise; ASIC; Noise; amplifier; quartz crystal oscillator; simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-8865-5
Type :
conf
DOI :
10.1109/FCS.2015.7138805
Filename :
7138805
Link To Document :
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