Title :
Least-square fit, Ω counters, and quadratic variance
Author :
Vernotte, F. ; Lenczner, M. ; Bourgeois, P.-Y. ; Rubiola, E.
Author_Institution :
UTINAM/Obs. THETA, Univ. of Franche-Comte, Besancon, France
Abstract :
This work is motivated by the wish to have the most precise measurement of a frequency ν and of the variance σy2 of its fractional fluctuations in a given time τ, out of high-end general-purpose instruments. Thanks to the progress of digital electronics, new time-interval analyzers have been made available in the last few years. Such instruments measure the time stamp of the input events at high sampling speed (MS/s), and with high resolution (10-100 ps). We propose the linear regression as a means to estimate the frequency from time stamps of the input signal. The frequency counter based on the linear regression is called Ω counter. The linear regression is interpreted as a finite impulse response filter which takes the frequency samples as the input, and delivers the estimated frequency at the output. We derive the transfer function of such filter, which turns out to be parabolic shaped. As compared to the H and Λ counters, the Ω counter features better rejection of the background noise. We define the quadratic variance (QVAR), a wavelet variance similar to the Allan variance, and we derive its statistical properties. The QVAR is superior to the AVAR and MVAR in the rejection of the background noise.
Keywords :
FIR filters; frequency measurement; least squares approximations; regression analysis; transfer functions; Ω counter; Allan variance; background noise rejection; finite impulse response filter; frequency measurement; least-square fit; linear regression; quadratic variance; statistical properties; transfer function; wavelet variance; Frequency modulation; Instruments; Linear regression; Noise; Radiation detectors; Time-frequency analysis;
Conference_Titel :
Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-8865-5
DOI :
10.1109/FCS.2015.7138854