DocumentCode
716016
Title
An atomic frequency micrometer based on the coherent population beating phenomenon
Author
Wang Zhong ; Zhao Jianye ; Zhao Xiaona ; Liu Li ; Zhuang Yuxin ; Li Dawei
Author_Institution
Sch. of Electron. Eng. & Comput. Sci., Peking Univ., Beijing, China
fYear
2015
fDate
12-16 April 2015
Firstpage
465
Lastpage
470
Abstract
We have demonstrated an atomic frequency micrometer based on the coherent population beating phenomenon, which enables us to obtain the beat frequency between the measured signal and the atomic transition frequency. The beat frequency and its fluctuations are detected and accurately measured through digital signal processing, which is capable of up to mHz or higher frequency resolutions (for GHz signal). The frequency discrimination via our method is comparable to that of the Ramsey fringes method, and the working range is no longer limited by the width of line shape. This enables us to achieve an atomic clock by actively compensating the frequency shift, which eliminates the need for a phase locking loop, and broadens the working range with increasing reliability. This novel scheme could be extended to the optical frequency region, implying possible future applications in optical atomic clocks, optical frequency comb, atomic spectroscopy and other related researches.
Keywords
atomic clocks; compensation; frequency measurement; micrometry; microsensors; phase locked loops; reliability; Ramsey fringe method; atomic frequency micrometer; atomic spectroscopy; atomic transition frequency; beat frequency detection; coherent population beating phenomenon; digital signal processing; frequency measurement; frequency shift compensation; optical atomic clock; optical frequency comb; optical frequency region; phase locking loop; reliability; Atom optics; Atomic clocks; Atomic measurements; Frequency measurement; Oscillators; Sociology; Statistics; CPB; CPT; micrometer;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International
Conference_Location
Denver, CO
Print_ISBN
978-1-4799-8865-5
Type
conf
DOI
10.1109/FCS.2015.7138883
Filename
7138883
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