Title :
NSPUDT using c-axis tilted ScAlN thin film
Author :
Kochhar, Abhay ; Yamamoto, Yasuo ; Teshigahara, Akihiko ; Hashimoto, Ken-ya ; Tanaka, Shuji ; Esashi, Masayoshi
Author_Institution :
WPI (Adv. Inst. for Mater. Res.), Tohoku Univ., Sendai, Japan
Abstract :
This paper reports finding of directionality in the 44% Scandium doped Aluminum Nitride thin film based surface acoustic wave devices. Some previously reported SAW devices using bulk substrates showed higher power of acoustic signals in either forward or backward direction depending on their crystal orientations and are called natural single-phase unidirectional transducers (NSPUDT). As these reports were based on bulk substrates, for the first time, we report NSPUDT using c-axis tilted Scandium doped Aluminum Nitride thin film SAW devices on sapphire. In addition, we also examined the c-axis tilt dependency to improve transducers return loss. It is worth to put in notice here that our observance of directionality is specifically in sezawa wave. Hence, the comparison for both acoustic waves i.e. Rayleigh and Sezawa is also reported.
Keywords :
bulk acoustic wave devices; phase measurement; sapphire; scandium compounds; surface acoustic wave transducers; thin film sensors; NSPUDT; Rayleigh acoustic wave; SAW device; ScAlN; Sezawa acoustic wave; acoustic signal; bulk substrate; c-axis tilted thin film; natural single-phase unidirectional transducer; sapphire; scandium doped aluminum nitride; surface acoustic wave device; Aluminum nitride; Films; Substrates; Surface acoustic wave devices; Surface acoustic waves; Transducers; NSPUDT; SAW devices; Sc-doped Aluminum Nitride thin film; c-axis tilted thin film;
Conference_Titel :
Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-8865-5
DOI :
10.1109/FCS.2015.7138925