Title :
Extracting low-dimensional control variables for movement primitives
Author :
Rueckert, Elmar ; Mundo, Jan ; Paraschos, Alexandros ; Peters, Jan ; Neumann, Gerhard
Author_Institution :
Intell. Autonomous Syst. Lab., Tech. Univ. Darmstadt, Darmstadt, Germany
Abstract :
Movement primitives (MPs) provide a powerful framework for data driven movement generation that has been successfully applied for learning from demonstrations and robot reinforcement learning. In robotics we often want to solve a multitude of different, but related tasks. As the parameters of the primitives are typically high dimensional, a common practice for the generalization of movement primitives to new tasks is to adapt only a small set of control variables, also called meta parameters, of the primitive. Yet, for most MP representations, the encoding of these control variables is pre-coded in the representation and can not be adapted to the considered tasks. In this paper, we want to learn the encoding of task-specific control variables also from data instead of relying on fixed meta-parameter representations. We use hierarchical Bayesian models (HBMs) to estimate a low dimensional latent variable model for probabilistic movement primitives (ProMPs), which is a recent movement primitive representation. We show on two real robot datasets that ProMPs based on HBMs outperform standard ProMPs in terms of generalization and learning from a small amount of data and also allows for an intuitive analysis of the movement. We also extend our HBM by a mixture model, such that we can model different movement types in the same dataset.
Keywords :
Bayes methods; mixture models; robots; HBM; ProMP; hierarchical Bayesian models; latent variable model; low-dimensional control variable extraction; mixture model; movement primitive representation; probabilistic movement primitives; robot; Adaptation models; Bayes methods; Computational modeling; Data models; Probabilistic logic; Robots; Trajectory;
Conference_Titel :
Robotics and Automation (ICRA), 2015 IEEE International Conference on
Conference_Location :
Seattle, WA
DOI :
10.1109/ICRA.2015.7139390