• DocumentCode
    716636
  • Title

    Time-varying automated manufacturing systems and their event-based control: A Petri net approach

  • Author

    Chen Chen ; Hesuan Hu

  • Author_Institution
    Sch. of Electro-Mech. Eng., Xidian Univ., Xi´an, China
  • fYear
    2015
  • fDate
    26-30 May 2015
  • Firstpage
    3833
  • Lastpage
    3840
  • Abstract
    As an important branch of production facilities, automated manufacturing systems are a promising perspective of modern factories which become increasingly complex and flexible. From the perspective of development, time variable is a significant concern. In this paper, we propose a class of time-varying systems, Tv-S4R. After involving a global time information loop, it can represent realistic system whose manufacturing process varies with time variables. Event-based control is introduced for serving two important purposes. First, it exerts time-varying specifications on the system, i.e., different processes are executed at different time stages. Second, it prevents the system from reaching any first-met bad marking which will eventually result in deadlocks. We will show that the event-based control can enhance our specifications´ expressivity capability compared to their state-based counterparts in terms of generalized mutual exclusion constraints. At last, supervisors are simplified according to the identification of dependence and independence of inequalities. An experimental study illustrates the application of Tv-S4R and the effectiveness of event-based control method.
  • Keywords
    Petri nets; manufacturing systems; production facilities; time-varying systems; Petri net approach; Tv-S4R; event-based control method; generalized mutual exclusion constraints; global time information loop; production facility; time-varying automated manufacturing systems; Monitoring; Petri nets; Production facilities; System recovery; TV; Time-varying systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Automation (ICRA), 2015 IEEE International Conference on
  • Conference_Location
    Seattle, WA
  • Type

    conf

  • DOI
    10.1109/ICRA.2015.7139733
  • Filename
    7139733