Title : 
Leveraging big data for grasp planning
         
        
            Author : 
Kappler, Daniel ; Bohg, Jeannette ; Schaal, Stefan
         
        
            Author_Institution : 
Autonomous Motion Dept., Max-PlanckInstitute for Intell. Syst., Tubingen, Germany
         
        
        
        
        
        
            Abstract : 
We propose a new large-scale database containing grasps that are applied to a large set of objects from numerous categories. These grasps are generated in simulation and are annotated with different grasp stability metrics. We use a descriptive and efficient representation of the local object shape at which each grasp is applied. Given this data, we present a two-fold analysis: (i) We use crowdsourcing to analyze the correlation of the metrics with grasp success as predicted by humans. The results show that the metric based on physics simulation is a more consistent predictor for grasp success than the standard υ-metric. The results also support the hypothesis that human labels are not required for good ground truth grasp data. Instead the physics-metric can be used to generate datasets in simulation that may then be used to bootstrap learning in the real world. (ii) We apply a deep learning method and show that it can better leverage the large-scale database for prediction of grasp success compared to logistic regression. Furthermore, the results suggest that labels based on the physics-metric are less noisy than those from the υ-metric and therefore lead to a better classification performance.
         
        
            Keywords : 
Big Data; control engineering computing; database management systems; grippers; planning (artificial intelligence); Big Data; grasp planning; large-scale database; learning method; logistic regression; physics simulation; physics-metric; Databases; Noise measurement; Robots; Shape; Stability analysis; Three-dimensional displays;
         
        
        
        
            Conference_Titel : 
Robotics and Automation (ICRA), 2015 IEEE International Conference on
         
        
            Conference_Location : 
Seattle, WA
         
        
        
            DOI : 
10.1109/ICRA.2015.7139793