• DocumentCode
    716720
  • Title

    Self-tuning M-estimators

  • Author

    Agamennoni, G. ; Furgale, P. ; Siegwart, R.

  • Author_Institution
    Autonomous Syst. Lab. (ASL), ETH Zurich, Zurich, Switzerland
  • fYear
    2015
  • fDate
    26-30 May 2015
  • Firstpage
    4628
  • Lastpage
    4635
  • Abstract
    M-estimators are the de-facto standard method of robust estimation in robotics. They are easily incorporated into iterative non-linear least-squares estimation and provide seamless and effective handling of outliers in data. However, every M-estimator´s robust loss function has one or more tuning parameters that control the influence of different data. The choice of M-estimator and the manual tuning of these parameters is always a source of uncertainty when applying the technique to new data or a new problem. In this paper we develop the concept of self-tuning M-estimators. We first make the connection between many common M-estimators and elliptical probability distributions. This connection shows that the choice of M-estimator is an assumption that the residuals belong to a well-defined elliptical distribution. We exploit this implication in two ways. First, we develop an algorithm for tuning the M-estimator parameters during iterative optimization. Second, we show how to choose the correct M-estimator for your data by examining the likelihood of the data given the model. We fully derive these algorithms and show their behavior on a representative example of visual simultaneous localization and mapping.
  • Keywords
    iterative methods; least squares approximations; mobile robots; optimisation; self-adjusting systems; statistical distributions; elliptical probability distributions; iterative nonlinear least-squares estimation; iterative optimization; robust estimation; self-tuning M-estimators; Cost function; Data models; Robustness; Simultaneous localization and mapping; Switches; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Automation (ICRA), 2015 IEEE International Conference on
  • Conference_Location
    Seattle, WA
  • Type

    conf

  • DOI
    10.1109/ICRA.2015.7139840
  • Filename
    7139840