DocumentCode :
718119
Title :
Ultra low-power 7T SRAM cell design based on CMOS
Author :
Moghaddam, Majid ; Moaiyeri, Mohammad Hossein ; Eshghi, Mohammad
Author_Institution :
ECE Dept., Shahid Beheshti Univ., Tehran, Iran
fYear :
2015
fDate :
10-14 May 2015
Firstpage :
1357
Lastpage :
1361
Abstract :
In his paper a 7T SRAM cell operating well in low voltages is presented. Suitable read operation structure is provided by controlling the drain induced barrier lowering (DIBL) effect and body-source voltage in the hold `1´ state. The read-operation structure of the proposed cell utilizes the single transistor which leads to a larger write margin. The simulation results at 90nm TSMC CMOS demonstrate the outperforms of the proposed SRAM cell in terms of power dissipation, write margin, sensitivity to process variations as compared with the other most efficient low-voltage SRAM cells.
Keywords :
CMOS memory circuits; SRAM chips; low-power electronics; DIBL effect; TSMC CMOS; body-source voltage; drain induced barrier lowering effect; power dissipation; process variations sensitivity; read operation structure; single transistor; size 90 nm; ultra low-power 7T SRAM cell; write margin; CMOS integrated circuits; Logic gates; SRAM cells; Stability analysis; Threshold voltage; Transistors; DIBL effect; Ultra low power; process variations; write margin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Engineering (ICEE), 2015 23rd Iranian Conference on
Conference_Location :
Tehran
Print_ISBN :
978-1-4799-1971-0
Type :
conf
DOI :
10.1109/IranianCEE.2015.7146428
Filename :
7146428
Link To Document :
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