Title :
I-V characteristics analysis of YBCO step-edge grain-boundary Josephson junctions
Author :
Esmaeili, Mohaddeseh ; Mohajeri, Roya ; Nazifi, Rana ; Vesaghi, Mohammad Ali ; Fardmanesh, Mehdi
Author_Institution :
Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran
Abstract :
We have measured and analyzed the I-V characteristics of high temperature superconductor (Y-Ba-Cu-O) single step edge Josephson junctions with two different widths versus temperatures down to 3.3K. The junctions showed the resistively shunted junction behavior. And the flux flow behavior was observed in some regions of operation of the 5μm wide junction characteristics which was analyzed according to the estimated penetration depth of the junction.
Keywords :
flux flow; high-temperature superconductors; superconducting junction devices; yttrium compounds; I-V characteristics analysis; YBCO step-edge grain-boundary Josephson junctions; YBa2Cu3O7; flux flow behavior; high temperature superconductor single step edge Josephson junctions; junction characteristics; shunted junction behavior; size 5 mum; Conferences; Decision support systems; Electrical engineering; I-V characteristics; flux-flow behavior; step-edge Josephson junctions;
Conference_Titel :
Electrical Engineering (ICEE), 2015 23rd Iranian Conference on
Conference_Location :
Tehran
Print_ISBN :
978-1-4799-1971-0
DOI :
10.1109/IranianCEE.2015.7146439
