Title :
Role of major burst leaders in modular hippocampal networks
Author :
Bisio, Marta ; Pasquale, Valentina ; Bosca, Alessandro ; Berdondini, Luca ; Chiappalone, Michela
Author_Institution :
Dept. of Neurosci. & Brain Technol., Ist. Italiano di Tecnol. (IIT), Genoa, Italy
Abstract :
The development of in vitro neuronal models constituted by patterned networks is of significant interest in the neuroscientific community and requires the convergence of electrophysiological studies with micro/nano-fabrication techniques. In this paper we make use of a methodology to induce self-organization of networks into two connected sub-populations grown onto commercially available Micro Electrode Arrays (MEAs) in order to understand the role of `burst leaders´ in generating the collective synchronous events (i.e. network bursts) spontaneously arising in dissociated cultures. Considering the multitude of connections shown by uniform neuronal cultures, the restraint of neurite outgrowth along specific pathways ensures a considerable control over network complexity. Here we exploit this topological configuration to investigate whether and how network burst generation is affected by the development of the network. Our results constitute important evidence that engineered neuronal networks are a powerful platform to systematically approach questions related to the dynamics of neuronal assemblies.
Keywords :
bioelectric phenomena; biomedical electrodes; brain; cellular biophysics; neurophysiology; MEA; burst leaders; collective synchronous events; electrophysiological convergence; in vitro neuronal models; microelectrode arrays; microfabrication techniques; modular hippocampal networks; nanofabrication techniques; network burst generation; network complexity; neurite out growth; neuronal assembly dynamics; neuronal networks; neuroscientific community; patterned networks; powerful platform; self-organization; topological configuration; uniform neuronal cultures; Computer architecture; Electrodes; In vitro; Neuroscience; Niobium; Propagation delay; Standards;
Conference_Titel :
Neural Engineering (NER), 2015 7th International IEEE/EMBS Conference on
Conference_Location :
Montpellier
DOI :
10.1109/NER.2015.7146677