DocumentCode :
718418
Title :
Physical mechanisms determining microwave dielectrics properties (Part 1. Thermal stability nature)
Author :
Poplavko, Y.M. ; Didenko, Y.V. ; Yakimenko, Y.I.
Author_Institution :
Dept. of Microelectron., Nat. Tech. Univ. of Ukraine “KPI”, Kiev, Ukraine
fYear :
2015
fDate :
21-24 April 2015
Firstpage :
23
Lastpage :
28
Abstract :
Several possibilities to combine high ε, low loss factor tanδ with thermal stability in one material are discussed. Dielectric spectroscopy method was used to study mechanisms of those dielectrics polarization.
Keywords :
dielectric losses; dielectric polarisation; permittivity; thermal stability; dielectric constant; dielectric polarization; dielectric spectroscopy; loss factor; microwave dielectric properties; thermal stability; Ceramics; Crystals; Dielectric losses; Microwave theory and techniques; Polarization; Thermal stability; internal polarity; loss factor; microwave dielectric; polarization; rare earth elements; thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Nanotechnology (ELNANO), 2015 IEEE 35th International Conference on
Conference_Location :
Kiev
Type :
conf
DOI :
10.1109/ELNANO.2015.7146827
Filename :
7146827
Link To Document :
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