DocumentCode :
718439
Title :
Packaging problem in microelectronics due to stress and fracture at the “metal-ceramic” interface
Author :
Korobova, N. ; Timoshenkov, S. ; Britkov, O. ; Shepelev, S. ; Mikheev, A.
Author_Institution :
Microelectron. Dept., Nat. Res. Univ. of Electron. Technol. (MIET), Moscow, Russia
fYear :
2015
fDate :
21-24 April 2015
Firstpage :
142
Lastpage :
144
Abstract :
The packaging of the integrated circuits requires knowledge of ceramics and metals to accommodate the fabrication of modules that are used to construct subsystems and entire systems from extremely small components. Stress analysis was conducted for a linear work-hardening metal cylinder embedded in an infinite composite ceramics (Al2O3 - SiO2) matrix. Sticking between metal and ceramic was established at high temperature and stresses developed during cooling to room temperature. It was noted that pore clusters were capable of initiating ductile rupture, by means of plastic instability, in the presence of appreciable tri-axiality.
Keywords :
ceramics; fatigue cracks; fracture; integrated circuit packaging; stress effects; Al2O3-SiO2; infinite composite ceramics; integrated circuit packaging; linear work-hardening metal cylinder; metal-ceramic interface fracture; metal-ceramic interface stress; metal-ceramic sticking; microelectronics packaging problem; stress analysis; Ceramics; Copper; Plastics; Residual stresses; Stress measurement; ceramic matrix; interface; packaging; stress analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Nanotechnology (ELNANO), 2015 IEEE 35th International Conference on
Conference_Location :
Kiev
Type :
conf
DOI :
10.1109/ELNANO.2015.7146855
Filename :
7146855
Link To Document :
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