DocumentCode
718450
Title
Properties of E-plane junctions for six-port measurements
Author
Karlov, V.A. ; Andreev, M.V. ; Borulko, V.F.
Author_Institution
Dept. of Phys., Electron. & Comput. Syst., Oles Honchar Dnipropetrovsk Nat. Univ., Dnipropetrovsk, Ukraine
fYear
2015
fDate
21-24 April 2015
Firstpage
200
Lastpage
203
Abstract
The problem of creating meter of complex reflection coefficient based on the electromagnetic approach using E-plane dividers is studied. Rigorous electromagnetic model of direct and inverse problems of five- and six-port measurements of complex reflection coefficient is derived. Frequency dependencies of model parameters are calculated. Properties of E-plane junctions are investigated.
Keywords
inverse problems; millimetre wave measurement; E-plane dividers; E-plane junctions; complex reflection coefficient; direct problems; electromagnetic model; inverse problems; six-port measurements; Antenna measurements; Approximation methods; Electromagnetics; Frequency measurement; Mathematical model; Reflection coefficient; Scattering; complex reflection coefficient; multiport waveguide discontinuity; six-port;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and Nanotechnology (ELNANO), 2015 IEEE 35th International Conference on
Conference_Location
Kiev
Type
conf
DOI
10.1109/ELNANO.2015.7146871
Filename
7146871
Link To Document