Title :
Properties of E-plane junctions for six-port measurements
Author :
Karlov, V.A. ; Andreev, M.V. ; Borulko, V.F.
Author_Institution :
Dept. of Phys., Electron. & Comput. Syst., Oles Honchar Dnipropetrovsk Nat. Univ., Dnipropetrovsk, Ukraine
Abstract :
The problem of creating meter of complex reflection coefficient based on the electromagnetic approach using E-plane dividers is studied. Rigorous electromagnetic model of direct and inverse problems of five- and six-port measurements of complex reflection coefficient is derived. Frequency dependencies of model parameters are calculated. Properties of E-plane junctions are investigated.
Keywords :
inverse problems; millimetre wave measurement; E-plane dividers; E-plane junctions; complex reflection coefficient; direct problems; electromagnetic model; inverse problems; six-port measurements; Antenna measurements; Approximation methods; Electromagnetics; Frequency measurement; Mathematical model; Reflection coefficient; Scattering; complex reflection coefficient; multiport waveguide discontinuity; six-port;
Conference_Titel :
Electronics and Nanotechnology (ELNANO), 2015 IEEE 35th International Conference on
Conference_Location :
Kiev
DOI :
10.1109/ELNANO.2015.7146871
