Title :
Equipment for testing and diagnostics of power semiconductor devices
Author :
Bespalov, N.N. ; Ilyin, M.V. ; Kapitonov, S.S.
Author_Institution :
Dept. of Electron. & Nanoelectron., Ogarev Mordovia State Univ., Saransk, Russia
Abstract :
This paper describes the hardware and software package for automatic diagnostics of power semiconductor devices for thermal parameters and the current-voltage characteristics in a high conductivity.
Keywords :
automatic test equipment; power engineering computing; power semiconductor devices; automatic diagnostics; current-voltage characteristics; diagnostics equipment; power semiconductor devices; software package; testing equipment; thermal parameters; Conductivity; Current-voltage characteristics; Power semiconductor devices; Semiconductor diodes; Temperature; Thermal conductivity; a state of high conductivity; current-voltage characteristic; hardware-software complex; power semiconductor devices; series connection diagnostics; thermal parameters; thermal resistance;
Conference_Titel :
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location :
Omsk
Print_ISBN :
978-1-4799-7102-2
DOI :
10.1109/SIBCON.2015.7146999
