DocumentCode
718548
Title
Automatic control system for memory chips performance in a radiation experiment
Author
Boruzdina, A.B. ; Orlov, A.A. ; Ulanova, A.V. ; Grigor´ev, N.G. ; Nikiforov, A.Y.
Author_Institution
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
fYear
2015
fDate
21-23 May 2015
Firstpage
1
Lastpage
4
Abstract
The paper analyzes the effectiveness of test algorithms of different duration during the functional control of static random access memory (SRAM) during the exposure to total ionizin dose (TID). The results of experimental research SRAM chips using an automated system based on the equipment PXI company National Instruments, justifying the use of the test algorithms such as “MARCH” (long-10N).
Keywords
SRAM chips; automatic testing; integrated circuit testing; automatic control system; memory chips performance; radiation experiment; static random access memory; test algorithms; total ionizing dose; Algorithm design and analysis; CMOS integrated circuits; Circuit faults; Frequency measurement; Microelectronics; Random access memory; Testing; PXI-7951R; memory chips; test algorithm;
fLanguage
English
Publisher
ieee
Conference_Titel
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location
Omsk
Print_ISBN
978-1-4799-7102-2
Type
conf
DOI
10.1109/SIBCON.2015.7147007
Filename
7147007
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