Title :
Automatic control system for memory chips performance in a radiation experiment
Author :
Boruzdina, A.B. ; Orlov, A.A. ; Ulanova, A.V. ; Grigor´ev, N.G. ; Nikiforov, A.Y.
Author_Institution :
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
The paper analyzes the effectiveness of test algorithms of different duration during the functional control of static random access memory (SRAM) during the exposure to total ionizin dose (TID). The results of experimental research SRAM chips using an automated system based on the equipment PXI company National Instruments, justifying the use of the test algorithms such as “MARCH” (long-10N).
Keywords :
SRAM chips; automatic testing; integrated circuit testing; automatic control system; memory chips performance; radiation experiment; static random access memory; test algorithms; total ionizing dose; Algorithm design and analysis; CMOS integrated circuits; Circuit faults; Frequency measurement; Microelectronics; Random access memory; Testing; PXI-7951R; memory chips; test algorithm;
Conference_Titel :
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location :
Omsk
Print_ISBN :
978-1-4799-7102-2
DOI :
10.1109/SIBCON.2015.7147007
