Title :
The automated test system for parametric and functional control of the modern transceiver IC´s
Author :
Davydov, G.G. ; Kolosova, A.S. ; Kessarinsky, L.N. ; Boychenko, D.V.
Author_Institution :
Nat. Res. Nucl. Univ. MEPhI (Moscow Eng. Phys. Inst.), Moscow, Russia
Abstract :
The article describes the automated complex of parametric and functional control of the wide range of industrial transceivers IC´s by using PXI family of National Instruments equipment. The capabilities of the designed system are observed as well as the software.
Keywords :
automatic test equipment; integrated circuits; transceivers; National Instruments equipment; PXI family; automated complex; automated test system; functional control; modern transceiver IC; parametric control; Current measurement; Frequency measurement; Integrated circuits; Nickel; Temperature measurement; Transceivers; Voltage measurement; PXI; parametric and functional test; receiver; transceiver;
Conference_Titel :
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location :
Omsk
Print_ISBN :
978-1-4799-7102-2
DOI :
10.1109/SIBCON.2015.7147094
