Title :
Automated radiation test setup for functional and parametrical control of 8-bit microcontrollers
Author :
Loskutov, I.O. ; Karakozov, A.B. ; Nekrasov, P.V. ; Nikiforov, A.Yu.
Author_Institution :
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
The developed automated setup for functional and parametric control of 8-bit microcontrollers during radiation hardness tests is presented. The setup hardware is based on the NI modular instruments PXI-7841R and PXI-4110 operated under LabVIEW software. Test circuit and methods together with the user software structure and typical test results are presented.
Keywords :
hardness testing; microcontrollers; virtual instrumentation; LabVIEW software; NI modular instruments; PXI-4110; PXI-7841R; automated radiation test setup; functional control; microcontrollers; parametric control; parametrical control; radiation hardness tests; setup hardware; test circuit; user software structure; word length 8 bit; Current measurement; Hardware; Instruments; Microcontrollers; Microelectronics; Random access memory; Software; LabVIEW; PXI-4110; PXI-7841R; functional control; microcontroller; parametric control; power supply current; radiation hardness; test setup; total ionizing dose;
Conference_Titel :
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location :
Omsk
Print_ISBN :
978-1-4799-7102-2
DOI :
10.1109/SIBCON.2015.7147128
