Title :
Using modules NI PXI-7841R rapid I/O modulefor the functional control of the microprocessors
Author :
Marfin, V.A. ; Nekrasov, P.V. ; Kalashnikov, O.A. ; Kagirina, K.A.
Author_Institution :
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
The article discusses the use of a NI PXI-7841R module to control the operation of VLSI microprocessors in terms of radiation experiment. The article also discusses the use of the NI PXIe-7962R module in conjunction with the module NI PXI-7841R to expand measurement system possibilities.
Keywords :
VLSI; microcomputers; radiation hardening (electronics); NI PXI-7841R module; VLSI microprocessor; microprocessor functional control; radiation hardness; rapid I/O module; Field programmable gate arrays; Microelectronics; Microprocessors; Nickel; Radiation effects; Testing; Very large scale integration; PXI-7841R; PXIe-7962R; microprocessor; radiation hardness;
Conference_Titel :
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location :
Omsk
Print_ISBN :
978-1-4799-7102-2
DOI :
10.1109/SIBCON.2015.7147142
