Title :
Implementing the mode of spectroscopic measurement in piezoresponse force microscopy into the cryogenic atomic force microscope
Author :
Andreeva, N. ; Ustinov, A. ; Filimonov, A.
Author_Institution :
Phys. Electron. Dept., St. Petersburg State Polytech. Univ., St. Petersburg, Russia
Abstract :
A scheme of spectroscopic measurements in piezoresponse force microscopy technique was developed and implemented into the cryogenic atomic force microscope AttoAFM I (Attocube, Germany). For this purpose an external functional generator FC 120 (Yokogawa Electric Corporation, Japan) and a lock-in amplifier SR 844 (Stanford Research Systems Inc., USA) were connected to the computer of cryogenic microscope. System was synchronized and controlled by LabVIEW via NI GPIB-USB-HS adapter. Developed scheme of spectroscopic measurements allows obtaining hysteresis loops in piezoresponse force microscopy regime in the temperature range of 4 - 295 K from great variety of objects starting from thin piezoelectric films and ending by bulk crystals and piezoceramics.
Keywords :
amplifiers; atomic force microscopy; cryogenics; piezoceramics; piezoelectric thin films; virtual instrumentation; AttoAFM I; LabVIEW; NI GPIB-USB-HS adapter; bulk crystals; cryogenic atomic force microscope; external functional generator FC 120; hysteresis loops; lock-in amplifier SR 844; piezoceramics; piezoresponse force microscopy; spectroscopic measurement; temperature 4 K to 295 K; thin piezoelectric films; Atomic force microscopy; Atomic measurements; Cryogenics; Force; Surface topography; cryogenic atomic force microscope; spectroscopic measurements by piezoresponse force microscopy technique;
Conference_Titel :
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location :
Omsk
Print_ISBN :
978-1-4799-7102-2
DOI :
10.1109/SIBCON.2015.7147300
