Detecting unit for X-ray nondestructive testing systems

To provide an adequate X-ray detection efficiency is a real challenge to designers of digital radiographic systems for different applications, including medicine, biology, and nondestructive testing of materials and structural members. Analysis of the state-of-the art digital radiographic systems shows that the greatest body of information is obtained from imaging systems based on semiconductor X-ray detectors (Si, GaAs, Cd₁-_xZn_xTe). Results of development of detecting unit for x-ray nondestructive testing systems are described in this paper.