DocumentCode :
718826
Title :
IBIS models based on experimental data
Author :
Dmitriev, Stepan N. ; Levitskiy, Alexey A.
Author_Institution :
Inst. of Eng. Phys. & Radio Electron., Siberian Fed. Univ., Krasnoyarsk, Russia
fYear :
2015
fDate :
21-23 May 2015
Firstpage :
1
Lastpage :
4
Abstract :
In this work we discuss experimental methods of IBIS models creation. The main attention is paid to interpretation of measured I-V curves of digital integrated circuits input and output buffers. Coupled with simulations, the experimental methodology can significantly reduce complexity and time for IBIS models generation.
Keywords :
buffer circuits; computational complexity; digital integrated circuits; IBIS model generation; digital integrated circuits; input buffer; input/output buffer information specification; measured I-V curves; time complexity; Analytical models; Clamps; Data models; Integrated circuit modeling; SPICE; Semiconductor device modeling; IBIS models; signal integrity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location :
Omsk
Print_ISBN :
978-1-4799-7102-2
Type :
conf
DOI :
10.1109/SIBCON.2015.7147339
Filename :
7147339
Link To Document :
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