Electrical bistable properties of ZnO nanoparticles thin film prepared by electrostatic spray deposition technique

Author

Chaithanatkun, Natpasit ; Chantarawong, Direklit ; Songkeaw, Potiyan ; Onlaor, Korakot ; Thiwawong, Thutiyaporn ; Tunhoo, Benchapol

Author_Institution

Electron. & Control Syst. for Nanodevice Res. Lab., King Mongkut´s Inst. of Technol. Ladkrabang, Bangkok, Thailand

fYear

2015

fDate

7-11 April 2015

Firstpage

152

Lastpage

155

Abstract

Thin films of zinc oxide nanoparticles (ZnO NPs) for bistable device was prepared by electrostatic spray deposition technique based on an indium-tin oxide/ZnO NPs/aluminum (ITO/ZnO NPs /Al) structure. The characterizations of ZnO NPs films were performed using X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM). The influence of the deposition time on properties of films was also investigated. Moreover, the effect of deposition time on the bistable properties can be performed by current-voltage (I-V) measurements. The conduction mechanism of the bistable device was analyzed by theoretical model.

Keywords

II-VI semiconductors; X-ray diffraction; aluminium; field emission electron microscopy; indium compounds; nanoparticles; scanning electron microscopy; semiconductor growth; semiconductor thin films; semiconductor-metal boundaries; spray coating techniques; wide band gap semiconductors; zinc compounds; ITO-ZnO-Al; X-ray diffraction; bistable device; conduction mechanism; current-voltage measurements; deposition time; electrical bistable properties; electrostatic spray deposition technique; field emission scanning electron microscopy; nanoparticles; thin film; Electrostatic discharges; Films; II-VI semiconductor materials; Nanoparticles; Switches; Tunneling; Zinc oxide; ESD; bistable device; electrostatic spray deposition; zinc oxide films;

fLanguage

English

Publisher

ieee

Conference_Titel

Nano/Micro Engineered and Molecular Systems (NEMS), 2015 IEEE 10th International Conference on

Conference_Location

Xi´an

Type

conf

DOI

10.1109/NEMS.2015.7147398

Filename

7147398