Title :
Characterization and Modeling of Advanced Placement Algorithms for NAND Flash Arrays
Author :
Miccoli, Carmine ; Sarpatwari, Karthik ; Di Cicco, Domenico ; Cichocki, Mattia ; Moschiano, Violante ; Ruby, Paul ; Parat, Krishna
Author_Institution :
Micron Technol. Inc., Boise, ID, USA
Abstract :
This work aims at providing an accurate and flexible tool to simulate the most advanced placement algorithms for state-of-the-art NAND Flash devices. A model for incremental step pulse programming is discussed and experimentally validated, showing its capability to describe the dependence on the program pulse duration/amplitude and to correctly reproduce the proximity effect and the selective slow program convergence behavior, when a bit line/channel bias is applied. Finally, when the entire memory array is simulated in a Monte Carlo fashion, the placement of our decananometer 3bit/cell device can be accurately reproduced, including the behavior of the advanced programming features.
Keywords :
Monte Carlo methods; NAND circuits; flash memories; integrated circuit modelling; Monte Carlo fashion; NAND flash arrays; NAND flash devices; advanced placement algorithms; bit line-channel bias; decananometer-cell device; incremental step pulse programming; memory array; program pulse duration-amplitude; proximity effect; selective slow program convergence behavior; word length 3 bit; Computational modeling; Electron devices; Flash memories; Mathematical model; Monte Carlo methods; Programming; Transient analysis;
Conference_Titel :
Memory Workshop (IMW), 2015 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-6931-2
DOI :
10.1109/IMW.2015.7150279