• DocumentCode
    719530
  • Title

    Characterization and Modeling of Advanced Placement Algorithms for NAND Flash Arrays

  • Author

    Miccoli, Carmine ; Sarpatwari, Karthik ; Di Cicco, Domenico ; Cichocki, Mattia ; Moschiano, Violante ; Ruby, Paul ; Parat, Krishna

  • Author_Institution
    Micron Technol. Inc., Boise, ID, USA
  • fYear
    2015
  • fDate
    17-20 May 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This work aims at providing an accurate and flexible tool to simulate the most advanced placement algorithms for state-of-the-art NAND Flash devices. A model for incremental step pulse programming is discussed and experimentally validated, showing its capability to describe the dependence on the program pulse duration/amplitude and to correctly reproduce the proximity effect and the selective slow program convergence behavior, when a bit line/channel bias is applied. Finally, when the entire memory array is simulated in a Monte Carlo fashion, the placement of our decananometer 3bit/cell device can be accurately reproduced, including the behavior of the advanced programming features.
  • Keywords
    Monte Carlo methods; NAND circuits; flash memories; integrated circuit modelling; Monte Carlo fashion; NAND flash arrays; NAND flash devices; advanced placement algorithms; bit line-channel bias; decananometer-cell device; incremental step pulse programming; memory array; program pulse duration-amplitude; proximity effect; selective slow program convergence behavior; word length 3 bit; Computational modeling; Electron devices; Flash memories; Mathematical model; Monte Carlo methods; Programming; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Workshop (IMW), 2015 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4673-6931-2
  • Type

    conf

  • DOI
    10.1109/IMW.2015.7150279
  • Filename
    7150279