• DocumentCode
    719553
  • Title

    Understanding NAND???s Intrinsic Characteristics Critical Role in Solid State Drive (SSD) Design

  • Author

    Akin, Will

  • Author_Institution
    Nonvolatile Memory Solutions, Micron Technol., Inc., Milpitas, CA, USA
  • fYear
    2015
  • fDate
    17-20 May 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The use of NAND flash-based SSDs in enterprises has grown at a ~33% compound annual growth rate [1] worldwide for the past three years. The majority of the growth comes from enterprise data center applications where the trend is to leverage the cost benefits of using MLC and TLC NAND flash memory by focusing on the use model behavior to optimize performance and life characteristics. In the data center, requirements for these MLC/TLC SSDs demand high sequential performance and reliability, moderate IOPS, and low power consumption along with maintaining 3 to 5 years of useful life. These challenges are tackled by tightening the links between the SSD´s operation, host operating environment, and intrinsic NAND memory behavior and by exploiting increasingly sophisticated controllers, firmware, and flash memory error management techniques.
  • Keywords
    NAND circuits; flash memories; logic design; MLC/TLC SSD; NAND flash memory; NAND flash-based SSD; NAND intrinsic characteristics; enterprise data center applications; firmware; flash memory error management techniques; host operating environment; intrinsic NAND memory behavior; life characteristics; solid state drive; use model behavior; Error correction codes; Flash memories; Microprogramming; Quality of service; Reliability; Solids; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Workshop (IMW), 2015 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4673-6931-2
  • Type

    conf

  • DOI
    10.1109/IMW.2015.7150310
  • Filename
    7150310