DocumentCode
719553
Title
Understanding NAND???s Intrinsic Characteristics Critical Role in Solid State Drive (SSD) Design
Author
Akin, Will
Author_Institution
Nonvolatile Memory Solutions, Micron Technol., Inc., Milpitas, CA, USA
fYear
2015
fDate
17-20 May 2015
Firstpage
1
Lastpage
4
Abstract
The use of NAND flash-based SSDs in enterprises has grown at a ~33% compound annual growth rate [1] worldwide for the past three years. The majority of the growth comes from enterprise data center applications where the trend is to leverage the cost benefits of using MLC and TLC NAND flash memory by focusing on the use model behavior to optimize performance and life characteristics. In the data center, requirements for these MLC/TLC SSDs demand high sequential performance and reliability, moderate IOPS, and low power consumption along with maintaining 3 to 5 years of useful life. These challenges are tackled by tightening the links between the SSD´s operation, host operating environment, and intrinsic NAND memory behavior and by exploiting increasingly sophisticated controllers, firmware, and flash memory error management techniques.
Keywords
NAND circuits; flash memories; logic design; MLC/TLC SSD; NAND flash memory; NAND flash-based SSD; NAND intrinsic characteristics; enterprise data center applications; firmware; flash memory error management techniques; host operating environment; intrinsic NAND memory behavior; life characteristics; solid state drive; use model behavior; Error correction codes; Flash memories; Microprogramming; Quality of service; Reliability; Solids; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Workshop (IMW), 2015 IEEE International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4673-6931-2
Type
conf
DOI
10.1109/IMW.2015.7150310
Filename
7150310
Link To Document