Title :
Photocurrent measurement through frequency domain analysis
Author :
Tiew, Chee-Chiang Derrick ; Ye Chow Kuang
Author_Institution :
Sch. of Eng., Monash Univ. Malaysia, Bandar Sunway, Malaysia
Abstract :
This paper presents the technique of using the frequency response function statistics of a photosensor to perform indirect light intensity measurement. Both random phase multisine and Gaussian noise source were designed as the excitation signals to the photodetector circuit. A miniature solar cell was used to provide the photo-generated current in tandem with different light irradiance from a LED light bulb with brightness control. The results show that the standard deviation of the frequency response function is a monotonic function of the photo-generated currents. Larger current (or light intensity) produces larger standard deviation. This promising result provides an indirect method to measure the photo response of optical sensors especially those sensors that produce minute photocurrent, thus avoiding environmental interference faced in wide-band direct current measurement technique.
Keywords :
Gaussian noise; electric current measurement; frequency response; frequency-domain analysis; interference suppression; light emitting diodes; optical sensors; photoconductivity; photodetectors; photoemission; photometry; random processes; Gaussian noise source method; LED light bulb; brightness control; environmental interference avoidance; frequency domain analysis; frequency response function statistics; indirect light intensity measurement; light irradiance; miniature solar cell; monotonic function; optical sensor; photodetector circuit; photogenerated current measurement; photoresponse; photosensor; random phase multisine method; wideband direct current measurement technique; Current measurement; Frequency measurement; Gaussian noise; Impedance; Photoconductivity; Sensors; Standards; Gaussian noise; best linear approximation; frequency response function (FRF); photosensor; random phase multisine;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
DOI :
10.1109/I2MTC.2015.7151308