Title :
Simultaneous measurement of conveyor belt speed and vibration using an electrostatic sensor array
Author :
Yonghui Hu ; Lijuan Wang ; Xiaoyu Wang ; Xiangchen Qian ; Yong Yan
Author_Institution :
Sch. of Control & Comput. Eng., North China Electr. Power Univ., Beijing, China
Abstract :
Accurate and reliable measurement of conveyor belt speed and vibration is of great importance in a variety of production and manufacturing industries. This paper presents the design, implementation and experimental assessment of an electrostatic sensor array for simultaneous measurement of conveyor belt speed and vibration in an on-line, continuous and non-contact manner. The sensor array is arranged in a 2×3 matrix, with the belt running between two rows, each having three identical sensing elements. The three signals in a row are cross-correlated for speed calculation and the results are fused to give accurate measurement. The dominant vibration mode of the belt is identified by analyzing the spectra of the sensor signals in a column. Experiments conducted on a purpose-built test rig show that the system can measure belt speed with relative error less than ±1.25% over the range of 2 to 10 m/s. Both the dominant vibration frequency and amplitude increase with the belt speed, but the amplitude will saturate when the belt stretch limit is reached at a higher belt speed.
Keywords :
array signal processing; belts; conveyors; velocity measurement; vibration measurement; vibrational signal processing; electrostatic sensor array; identical sensing elements; manufacturing industries; production industries; purpose-built test rig; sensor signal spectra analysis; simultaneous conveyor belt speed-vibration measurement; speed calculation; vibration frequency; Arrays; Belts; Electrodes; Electrostatic measurements; Electrostatics; Vibration measurement; Vibrations; Conveyor belt; cross-correlation; electrostatic sensor; non-contact measurement; sensor array; strip speed; strip vibration;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
DOI :
10.1109/I2MTC.2015.7151363