Title :
Chemical and magnetic properties characterization of magnetic nanoparticles
Author :
Bertolucci, Elisa ; Galletti, Anna Maria Raspolli ; Antonetti, Claudia ; Piccinelli, Fabio ; Marracci, Mirko ; Tellini, Bernardo ; Visone, Ciro
Author_Institution :
Dept. of Chem. & Ind. Chem., Univ. of Pisa, Pisa, Italy
Abstract :
This paper deals with the characterization of magnetic iron oxide nanoparticles. Pure magnetite (Fe3O4) and noble metal doped magnetite were synthesized following a new sustainable microwave-assisted method. Furthermore, an experimental analysis was carried out to investigate the chemical and magnetic properties of these new nanopowders. Morphological and chemical characteristics of the pure magnetite and magnetite modified by noble metals such as palladium, platinum and ruthenium are provided together with the relevant B-H magnetic curve. Among the adopted measurement techniques, the purity of magnetite phase was analyzed via Fourier Transform Infrared Spectroscopy (FT-IR) and X-Ray Diffraction (XRD), while a Vibrating Sample Magnetometer (VSM) characterized the magnetic behavior of the nanopowder samples.
Keywords :
Fourier transform infrared spectra; X-ray diffraction; iron compounds; magnetic hysteresis; magnetic particles; microwave materials processing; nanofabrication; nanomagnetics; nanoparticles; palladium; platinum; ruthenium; B-H magnetic curve; FTIR spectroscopy; Fe3O4:Pd; Fe3O4:Pt; Fe3O4:Ru; Fourier transform infrared spectroscopy; VSM; X-ray diffraction; XRD; chemical characterization; magnetic hysteresis curves; magnetic iron oxide nanoparticles; magnetic properties; microwave-assisted method; morphological characteristics; nanopowders; noble metal doped magnetite; palladium; platinum; pure magnetite; ruthenium; vibrating sample magnetometry; Magnetic hysteresis; Magnetic resonance imaging; Magnetometers; Metals; Nanoparticles; Saturation magnetization; X-ray scattering; Pd@Fe3O4; Pt@Fe3O4; Ru@Fe3O4; experimental analysis; magnetic nanoparticles; magnetite;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
DOI :
10.1109/I2MTC.2015.7151498