DocumentCode
720141
Title
Metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements
Author
Arpaia, Pasquale ; Baccigalupi, Carlo ; Martino, Michele
Author_Institution
TE Dept., CERN, Geneva, Switzerland
fYear
2015
fDate
11-14 May 2015
Firstpage
1532
Lastpage
1536
Abstract
The metrological characterization of a custom designed ultra-low noise analogue front-end for an acquisition system for the measurement of flat-top of fast voltage pulses is presented. The system has challenging requirements, in particular for Common Mode Rejection Ratio (CMRR), thus custom methods have been defined, by illustrating the experimental results achieved at the European Organization for Nuclear Research (CERN) during the study of the new Compact LInear Collider (CLIC).
Keywords
analogue circuits; data acquisition; pulse measurement; voltage measurement; acquisition system; common mode rejection ratio; fast voltage pulses measurements; metrological characterization; ultralow noise analogue front-end; Atmospheric measurements; IEEE Xplore; Instruments; Particle measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location
Pisa
Type
conf
DOI
10.1109/I2MTC.2015.7151506
Filename
7151506
Link To Document