Title :
Metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements
Author :
Arpaia, Pasquale ; Baccigalupi, Carlo ; Martino, Michele
Author_Institution :
TE Dept., CERN, Geneva, Switzerland
Abstract :
The metrological characterization of a custom designed ultra-low noise analogue front-end for an acquisition system for the measurement of flat-top of fast voltage pulses is presented. The system has challenging requirements, in particular for Common Mode Rejection Ratio (CMRR), thus custom methods have been defined, by illustrating the experimental results achieved at the European Organization for Nuclear Research (CERN) during the study of the new Compact LInear Collider (CLIC).
Keywords :
analogue circuits; data acquisition; pulse measurement; voltage measurement; acquisition system; common mode rejection ratio; fast voltage pulses measurements; metrological characterization; ultralow noise analogue front-end; Atmospheric measurements; IEEE Xplore; Instruments; Particle measurements;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
DOI :
10.1109/I2MTC.2015.7151506
