• DocumentCode
    720159
  • Title

    Enhanced ADC sine wave histogram test

  • Author

    Max, Solomon ; Liggiero, Richard

  • Author_Institution
    LTX-Credence Corp., Norwood, MA, USA
  • fYear
    2015
  • fDate
    11-14 May 2015
  • Firstpage
    1652
  • Lastpage
    1657
  • Abstract
    An improved method of testing ADCs with a sine wave histogram is combined with an improved compression algorithm to accurately test the INL and DNL of ADCs. The accuracy of the compression algorithm is demonstrated with actual and simulated results. The role of THD and noise in the accuracy of the measurements is demonstrated. A previously reported method for reducing THD in an ac source is introduced as a method of improving ADC measurement accuracy.
  • Keywords
    analogue-digital conversion; integrated circuit testing; enhanced ADC sine wave histogram test; Arrays; Filtering; Histograms; Noise; Noise measurement; Testing; Uncertainty; ADC; DNL; Histogram; INL; THD;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
  • Conference_Location
    Pisa
  • Type

    conf

  • DOI
    10.1109/I2MTC.2015.7151527
  • Filename
    7151527
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=720159