DocumentCode :
720245
Title :
A system of systems analysis of a multi-probe SPM system
Author :
Cinar, Eyup ; Sahin, Ferat
Author_Institution :
Microsyst. Eng. Dept., Rochester Inst. of Technol., Rochester, NY, USA
fYear :
2015
fDate :
17-20 May 2015
Firstpage :
117
Lastpage :
121
Abstract :
In this paper, we introduce a multi-probe Scanning Probe Microscopy (SPM) tool in the context of system of systems (SoS) concepts. The tool exhibits strong characteristics of SoS such as interoperability, integration and independency of each individual system. Each probe terminal constitutes an independent scanning system that can operate individually. The interoperability of the systems through signal exchange bring strong advantages and help users in order to design innovative applications that would not be easily achievable when a single system is used. As an independent system, each probe terminal includes its own controller and feedback mechanism for precise operation which is controlled by individual software running on control PCs. After introducing the overall system, we briefly mention one of the innovative real-world applications that we have been currently working on in an effort to show the strength of SoS engineering and filling the gap between theory and practice.
Keywords :
feedback; scanning probe microscopy; systems analysis; SoS concepts; control PCs; controller mechanism; feedback mechanism; independent scanning system; multiprobe SPM system; probe terminal; scanning probe microscopy; system of system analysis; Interoperability; Monitoring; Nanobioscience; Probes; Sensors; Systems engineering and theory; Vibrations; Imaging; Multi-probe SPM System; Nanoindentation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System of Systems Engineering Conference (SoSE), 2015 10th
Conference_Location :
San Antonio, TX
Type :
conf
DOI :
10.1109/SYSOSE.2015.7151901
Filename :
7151901
Link To Document :
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