Title : 
Blade -- A Timing Violation Resilient Asynchronous Template
         
        
            Author : 
Hand, Dylan ; Trevisan Moreira, Matheus ; Hsin-Ho Huang ; Danlei Chen ; Butzke, Frederico ; Zhichao Li ; Gibiluka, Matheus ; Breuer, Melvin ; Vilar Calazans, Ney Laert ; Beerel, Peter A.
         
        
            Author_Institution : 
Ming Hsieh Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
         
        
        
        
        
        
            Abstract : 
Resilient designs offer the promise to remove increasingly large margins due to process, voltage, and temperature variations and take advantage of average-case data. However, proposed synchronous resilient schemes have either suffered from metastability or require modifying the architecture to add replay-based logic that recovers from timing errors, which leads to high timing error penalties and poses a design challenge in modern processors. This paper presents an asynchronous bundled-data resilient template called Blade that is robust to metastability issues, requires no replay-based logic, and has low timing error penalties. The template is supported by an automated design flow that synthesizes synchronous RTL designs to gate-level asynchronous Blade designs. The benefits of this flow are illustrated on Plasma, a 3-stage Open Core MIPS CPU. Our results demonstrate that a nominal area overhead of the asynchronous template of less than 10% leads to a 19% performance boost over the synchronous design due to average-case data and a 30-40% improvement when synchronous PVT margins are considered.
         
        
            Keywords : 
formal logic; timing; 3-stage OpenCore MIPS CPU; Plasma; asynchronous bundled-data resilient template; average-case data; gate-level asynchronous Blade designs; metastability issues; replay-based logic; synchronous PVT margins; synchronous resilient schemes; temperature variations; timing error penalties; timing violation resilient asynchronous template; Blades; Clocks; Delay lines; Delays; Latches; Logic gates;
         
        
        
        
            Conference_Titel : 
Asynchronous Circuits and Systems (ASYNC), 2015 21st IEEE International Symposium on
         
        
            Conference_Location : 
Mountain View, CA
         
        
        
        
            DOI : 
10.1109/ASYNC.2015.13