DocumentCode :
720606
Title :
Design and Analysis of Testable Mutual Exclusion Elements
Author :
Yang Zhang ; Heck, Leandro S. ; Moreira, Matheus T. ; Zar, David ; Breuer, Mel ; Calazans, Ney L. V. ; Beerel, Peter A.
Author_Institution :
Univ. of Southern California, Los Angeles, CA, USA
fYear :
2015
fDate :
4-6 May 2015
Firstpage :
124
Lastpage :
131
Abstract :
Mutual exclusion elements (MUTEXes) are fundamental components of asynchronous arbiters and are particularly critical to ensure metastable signals are properly filtered before reaching the arbiter outputs. However, despite their importance, the testability of these circuits is typically limited to functional testing. This paper discusses why this is not sufficient and addresses testability issues in both full-custom and standard-cell implementations. In particular, it proposes two new testable implementations that not only ensure improved coverage for single stuck-at faults but also enable testing the filtering of metastable signals. Additionally, this article quantifies the cost of the testable designs by comparing them to similar traditional designs in terms of area, power and metastability resolution time. Results show the proposed optimizations do increase area and power but have small impact on performance.
Keywords :
asynchronous circuits; circuit testing; network analysis; MUTEX; asynchronous arbiters; full-custom implementations; metastability resolution time; single stuck-at faults; standard-cell implementations; testable mutual exclusion elements; Circuit faults; Integrated circuit modeling; Inverters; Logic gates; Standards; Switches; Testing; MUTEX; Mutual exclusion element; arbiter; asynchronous circuits; metastability; tau; testability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asynchronous Circuits and Systems (ASYNC), 2015 21st IEEE International Symposium on
Conference_Location :
Mountain View, CA
ISSN :
1522-8681
Type :
conf
DOI :
10.1109/ASYNC.2015.28
Filename :
7152700
Link To Document :
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