• DocumentCode
    721056
  • Title

    Semi-supervised Multimodal Clustering Algorithm Integrating Label Signals for Social Event Detection

  • Author

    Zhenguo Yang ; Qing Li ; Zheng Lu ; Yun Ma ; Zhiguo Gong ; Haiwei Pan

  • Author_Institution
    Dept. of Comput. Sci., City Univ. of Hong Kong, Hong Kong, China
  • fYear
    2015
  • fDate
    20-22 April 2015
  • Firstpage
    32
  • Lastpage
    39
  • Abstract
    Photo-sharing social media sites provide new ways for users to share their experiences and interests on the Web, which aggregate large amounts of multimedia resources associated with a wide variety of real-world events in different types and scales. In this work, we aim to tackle social event detection from these large amounts of image collections by devising a semi-supervised multimodal clustering algorithm, denoted by SSMC, which exploits label signals to guide the fusion of the multimodal features. Particularly, SSMC takes advantage of the distribution over the similarities on a small amount of labeled data to represent the images, fusing multiple heterogeneous features seamlessly. As a result, SSMC has low computational complexity in processing multimodal features for both initial and updating stages. Experiments are conducted on the Mediaeval social event detection challenge, and the results show that our approach achieves better performance compared with the baseline algorithms.
  • Keywords
    computational complexity; feature extraction; image fusion; learning (artificial intelligence); pattern clustering; social networking (online); SSMC; computational complexity; label signals; multimodal feature fusion; semisupervised multimodal clustering algorithm; social event detection; Clustering algorithms; Complexity theory; Event detection; Feature extraction; Matrix decomposition; Media; Multimedia communication; Multimedia; Multimodal clustering; Social event detection; Social media;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia Big Data (BigMM), 2015 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-8687-3
  • Type

    conf

  • DOI
    10.1109/BigMM.2015.26
  • Filename
    7153853