• DocumentCode
    721451
  • Title

    CaF2-based UO2/Fe3O4 thin films: Crystal structure and magnetic exchange bias effect

  • Author

    Tereshina, E. ; Bao, Z. ; Havela, L. ; Mackova, A. ; Gouder, T. ; Caciuffo, R.

  • Author_Institution
    Dept. of Magn. Nanosyst., Inst. of Phys., Prague, Czech Republic
  • fYear
    2015
  • fDate
    11-15 May 2015
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Exchange interaction through interface between a ferromagnet and an antiferromagnet may result in the magnetic exchange bias (EB) effect [1]. The EB manifests itself as a shift of a magnetic hysteresis loop along the field direction. This property has become of a great technological value for applications in magnetic sensors based on spin-valves or tunnel junctions [2]. In this work, we studied crystal structure and magnetic EB effect in bilayers of antiferromagnetic UO2 (bulk Néel temperature 30.8 K) with ferrimagnetic Fe3O4. A reference UO2/Fe sample has been also prepared and studied. We used reactive sputter deposition from metallic U and Fe targets to prepare a set of samples with different Fe3O4 thicknesses while the thickness of the UO2 layer was kept constant. The samples were grown on commercially available CaF2 (100) and (111) substrates (CaF2 has an identical crystal structure and a lattice parameter within 0.5% of UO2). The layer of UO2 was deposited onto the substrate at elevated temperature (850 K), using a partial oxygen pressure of 1.2×10-6 mbar (Ar pressure of 6×10-3 mbar). Fe3O4 was deposited on the top of UO2 at the same partial oxygen pressure but at room temperature, in order to avoid interdiffusion. The stoichiometry of each deposited layer was controlled by X-ray Photoelectron Spectroscopy (XPS). A magnesium cap was deposited for protection on top of each sample. The samples have been characterized using X-ray diffraction.
  • Keywords
    Neel temperature; X-ray diffraction; X-ray photoelectron spectra; antiferromagnetic materials; crystal structure; exchange interactions (electron); ferrimagnetic materials; ferromagnetic materials; iron compounds; lattice constants; magnetic epitaxial layers; magnetic hysteresis; magnetic sensors; magnetic tunnelling; spin valves; sputter deposition; stoichiometry; uranium compounds; CaF2; CaF2 (100) substrates; CaF2 (111) substrates; UO2-Fe3O4; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; antiferromagnetic bilayers; bulk Neel temperature; crystal structure; elevated temperature; exchange interaction; ferrimagnetic; interdiffusion; lattice parameter; magnesium cap; magnetic exchange bias effect; magnetic hysteresis loop; magnetic sensors; partial oxygen pressure; reactive sputter deposition; spin-valves; stoichiometry; temperature 293 K to 298 K; thin films; tunnel junctions; Iron; Magnetic anisotropy; Magnetic hysteresis; Magnetic tunneling; Magnetometers; Soft magnetic materials; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference (INTERMAG), 2015 IEEE
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-7321-7
  • Type

    conf

  • DOI
    10.1109/INTMAG.2015.7156543
  • Filename
    7156543