DocumentCode :
721546
Title :
Adjacent and far track erasure dependence on media SUL permeability in shielded PMR head recording
Author :
Choe, G. ; Goncharov, A. ; Chu, F. ; Vanderheijden, P.
Author_Institution :
HGST a Western Digital Co., San Jose, CA, USA
fYear :
2015
fDate :
11-15 May 2015
Firstpage :
1
Lastpage :
1
Abstract :
Adjacent or far track erasure (ATE or FTE) in PMR recording can limit the recording track density. In a typical PMR head design, a shield is added near to the write pole to increase the write field gradient. The shield, however, leads to an additional flux path during writing, resulting in the erasure of neighboring tracks and bit error rate (BER) degradation. The media soft underlayer (SUL) is a part of the flux return path and its magnetic properties can also affect the ATE performance [1]. In this study, we report on systematic experimental and modelling results of ATE and FTE behavior of a PMR head with a wrapped-around shield (WAS) as a function of the SUL permeability and thickness.
Keywords :
error statistics; magnetic cores; magnetic heads; magnetic permeability; magnetic recording; permanent magnets; ATE behavior; FTE behavior; adjacent track erasure dependence; bit error rate degradation; far track erasure dependence; flux return path; magnetic properties; media SUL permeability; media soft underlayer permeability; recording track density; shielded PMR head recording; typical PMR head design; write field gradient; write pole; Bit error rate; Degradation; Finite element analysis; Magnetic heads; Media; Permeability; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7321-7
Type :
conf
DOI :
10.1109/INTMAG.2015.7156684
Filename :
7156684
Link To Document :
بازگشت