Title :
Towards Effective Bug Triage with Software Data Reduction Techniques
Author :
Jifeng Xuan ; He Jiang ; Yan Hu ; Zhilei Ren ; Weiqin Zou ; Zhongxuan Luo ; Xindong Wu
Author_Institution :
Sch. of Software, Dalian Univ. of Technol., Dalian, China
Abstract :
Software companies spend over 45 percent of cost in dealing with software bugs. An inevitable step of fixing bugs is bug triage, which aims to correctly assign a developer to a new bug. To decrease the time cost in manual work, text classification techniques are applied to conduct automatic bug triage. In this paper, we address the problem of data reduction for bug triage, i.e., how to reduce the scale and improve the quality of bug data. We combine instance selection with feature selection to simultaneously reduce data scale on the bug dimension and the word dimension. To determine the order of applying instance selection and feature selection, we extract attributes from historical bug data sets and build a predictive model for a new bug data set. We empirically investigate the performance of data reduction on totally 600,000 bug reports of two large open source projects, namely Eclipse and Mozilla. The results show that our data reduction can effectively reduce the data scale and improve the accuracy of bug triage. Ourwork provides an approach to leveraging techniques on data processing to form reduced and high-quality bug data in software development and maintenance.
Keywords :
data reduction; feature selection; program debugging; software maintenance; Eclipse; Mozilla; attribute extraction; bug data quality; bug triage; feature selection; instance selection; software data reduction techniques; software development; software maintenance; Accuracy; Computer bugs; Feature extraction; Prediction algorithms; Software; Text categorization; Mining software repositories; application of data preprocessing; bug data reduction; bug triage; data management in bug repositories; feature selection; instance selection; prediction for reduction orders;
Journal_Title :
Knowledge and Data Engineering, IEEE Transactions on
DOI :
10.1109/TKDE.2014.2324590