Title :
Large electromagnetic wave absorbing bandwidth of composites containing Fe3O4 nano ribbons
Author :
Wu, Y. ; Han, M. ; Deng, L.
Author_Institution :
Nat. Eng. Res. Center of Electromagn. Radiat. Control Mater., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
High operation frequency and large absorbing bandwidth are often required for electromagnetic noise suppression. Magnetic materials with strong anisotropy field (shape anisotropy or magnetocrystalline anisotropy), for instance FeCo nano plates, are needed to increase the operation frequency into the gigahertz (GHz) zone to solve the stringent problem of electromagnetic interference among the modern electronic devices. Traditional absorbers with magnetic inclusions suffer a narrow absorbing bandwidth due to the fact that only natural resonance losses can be exploited. In order to increase the absorbing bandwidth, other sources of high-frequency magnetic losses are demanded. Recently, it was reported that the exchange coupling between magnetic nanostructures can give rise to multi resonance phenomena. In this contribution, the magnetic losses arising from the multi resonances in nano ribbons will be investigated.
Keywords :
eddy current losses; electromagnetic wave absorption; exchange interactions (electron); iron compounds; magnetic anisotropy; magnetic leakage; nanocomposites; nanomagnetics; nanoribbons; Fe3O4; FeCo nanoplates; anisotropy field; composite electromagnetic wave absorbing bandwidth; electromagnetic interference; electromagnetic noise suppression; electronic devices; exchange coupling; gigahertz zone; high-frequency magnetic loss sources; magnetic inclusions; magnetic nanostructures; magnetocrystalline anisotropy; multiresonance phenomena; nanoribbons; narrow absorbing bandwidth; natural resonance losses; operation frequency; shape anisotropy; Anisotropic magnetoresistance; Bandwidth; Frequency dependence; Magnetic losses; Magnetic resonance imaging; Perpendicular magnetic anisotropy;
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7321-7
DOI :
10.1109/INTMAG.2015.7156927