DocumentCode :
721755
Title :
X-ray absorption spectra and self-bias ferromagnetic resonance of FeCoB films prepared by composition gradient sputtering
Author :
Xue, Q. ; Zhang, L. ; Li, J. ; Zhang, Y. ; Wang, C. ; Li, Q. ; Xu, J. ; Li, S.
Author_Institution :
Coll. of Phys. Sci., Qingdao Univ., Qingdao, China
fYear :
2015
fDate :
11-15 May 2015
Firstpage :
1
Lastpage :
1
Abstract :
In this study, Fe0.7Co0.3-B SMFs were prepared by CGS method, where B as a doping element distributes in sample with a gradient content increasing from 24.41 to 30.85 at .% for the test positions n from one terminal to the other, undergoing CB=22.8+1.61×n (at .%) . X-ray absorption spectra, shown in Fig . 1, demonstrates that the B doping atoms hybridize with Fe atoms, instead of alloying, as a result, with the increase of B content, Fe3+ atomic ratio increases considerably, leading to a decrease of saturation magnetization 4πMS from 16 .3 to 13 .5 kG (Fig . 2a) . However, the uniaxial magnetic anisotropy fields HK of the SMFs dramatically increase from 180.6 to 295.5 Oe, as a result, the ferromagnetic resonance frequency fFMR is driven from 4 .82 to 5 .62 GHz (Fig . 2b) . Figure 2b reveals that the ferromagnetic resonance is dominated by magnetic anisotropy field HK . Acknowledgments This work was financially supported by NSFC 11074040 and ZR2012FZ006 . The XAS was detected at BL08U1A beam station of Shanghai Synchrotron Radiation Facility .
Keywords :
X-ray absorption spectra; cobalt compounds; ferromagnetic resonance; iron compounds; magnetic anisotropy; magnetic thin films; sputter deposition; CGS method; FeCoB; X-ray absorption spectra; composition gradient sputtering; ferromagnetic resonance frequency; saturation magnetization; self bias ferromagnetic resonance; uniaxial magnetic anisotropy; Magnetic anisotropy; Magnetic films; Magnetic recording; Magnetic resonance; Microwave FET integrated circuits; Saturation magnetization; Sputtering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7321-7
Type :
conf
DOI :
10.1109/INTMAG.2015.7156976
Filename :
7156976
Link To Document :
بازگشت