DocumentCode
722071
Title
Electrical nonuniformity and non-ohmic current-voltage characteristics in Co2 FeSi film
Author
Huang, X. ; Lu, G. ; Yang, L. ; Huang, L. ; Pan, L.
Author_Institution
Coll. of Sci., Three Gorges Univ., Yichang, China
fYear
2015
fDate
11-15 May 2015
Firstpage
1
Lastpage
1
Abstract
The full Heusler compound Co2FeSi is one kind of half metal as its 100% spin polarization with Curie temperature as high as 1100K. It is interesting to investigate electrical property of Co2FeSi film for applications in magnetoelectric devices. The electrical characteristics of Co2FeSi film were investigated. The Co2FeSi film was 100nm and was prepared by magnetron sputtering at room-temperature on silicon. Resistance was investigated by four-probe method. The results from figure.1 showed that the Co2FeSi film represents low resistance metal conductor behavior at temperature T > 280K. However, with temperature decreasing down to T <; 280K, the resistance of the film increases sharply by about two magnitudes which representing semiconductor or insulator behavior. Interestingly, the resistance variation at low temperature (T <; 220K) is quite different at different currents. These results indicate that the film changed from electrical disorderd metal conductor phase to orderd insulator phase with temperature decreasing. And the film is electrical nonuniform at low temperature. However, the I-V characteristics from figure.2 show that it has non-ohmic behavior at temperature 260K <; T <; 320K. This non-ohmic behavior is opposite to the I-V characteristics of semiconductor. Comparing figure.1 and figure.2, we know that the film is not true metal conductor at T > 280K. Perhaps it is result from lattice defects in the film.
Keywords
Curie temperature; cobalt alloys; electrical resistivity; electron spin polarisation; iron alloys; silicon alloys; sputter deposition; thin films; Co2FeSi; Curie temperature; I-V characteristics; electrical nonuniformity; four probe method; full Heusler compound; lattice defects; magnetoelectric devices; magnetron sputtering; nonohmic current-voltage characteristics; resistance variation; spin polarization; Conductors; Magnetic films; Magnetoelectric effects; Metals; Resistance; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location
Beijing
Print_ISBN
978-1-4799-7321-7
Type
conf
DOI
10.1109/INTMAG.2015.7157366
Filename
7157366
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