• DocumentCode
    72209
  • Title

    Study of Properties of the Double-Deck Rail in the Electromagnetic Launching System

  • Author

    Lin Yang ; Jianxin Nie ; Qingjie Jiao ; Jun Li ; Ming Ren

  • Author_Institution
    State Key Lab. of Explosion Sci. & Technol., Beijing Inst. of Technol., Beijing, China
  • Volume
    43
  • Issue
    5
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    1531
  • Lastpage
    1535
  • Abstract
    Based on the fact that the double-deck rail demonstrates excellent performance in preventing rails melting and gouging during electromagnetic launch tests, theory and simulation research studies were carried out on the lateral vibration of the double-deck rail and contact properties between the armature and the rail in this paper. We deduced the lateral vibration contact equations of the double-deck rail by simplifying the electromagnetic rail launcher as Bernoulli-Euler model based on the elastic foundation. A finite-element code was used to help us model the launch progress. The influence of the double-deck rail scheme has been analyzed. Both the characteristics of the contact surface between the rail and the armature and the displacement of the rail were considered. The results show that the double-deck rail can inhibit the propagation of bending waves and efficiently reduce rail gouging. Besides, the connection method of the two decks has much influence on this effect.
  • Keywords
    electromagnetic launchers; finite element analysis; melting; railways; Bernoulli-Euler model; armature; bending wave propagation; contact surface characteristics; double-deck rail lateral vibration; electromagnetic launching system; electromagnetic rail launcher; finite element code; rail gouging reduction; rails melting preventing; Aluminum; Copper; Materials; Mathematical model; Rails; Springs; Steel; Double-deck rail; electromagnetic launch (EML); finite-element method; rail vibration; rail vibration.;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2015.2401331
  • Filename
    7045569